TY - GEN
T1 - Investigation of the Static Electrical Contact Behaviors of Rod and Spring for Micro-electromechanical-relay
AU - Zhang, Chao
AU - Fan, Wenbo
AU - Ren, Wanbin
AU - Luo, Fubiao
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - The structure configuration of rod and spring contacts is widely used in the micro electromechanical relay. Low and stable electrical contact resistance is a fundamental requirement for reliability and electrical life of relays. In this paper, the relationship between electrical contact resistance and contact force of rod and spring contacts is investigated explicitly with our designed test rig. In order to interpret the variations of contact resistance, the apparent contact area is estimated with the help of imaging system. In addition, the shift from the unstable contact regime to the stable one is determined with the use of contact resistance absolute value and fluctuation range. Moreover, a power law for contact resistance versus contact force R-c = KF -c-n is established with experimental measurements and theoretical calculations. The effects of surface roughness and Au coating thickness of samples on the static electrical contact resistance are discussed.
AB - The structure configuration of rod and spring contacts is widely used in the micro electromechanical relay. Low and stable electrical contact resistance is a fundamental requirement for reliability and electrical life of relays. In this paper, the relationship between electrical contact resistance and contact force of rod and spring contacts is investigated explicitly with our designed test rig. In order to interpret the variations of contact resistance, the apparent contact area is estimated with the help of imaging system. In addition, the shift from the unstable contact regime to the stable one is determined with the use of contact resistance absolute value and fluctuation range. Moreover, a power law for contact resistance versus contact force R-c = KF -c-n is established with experimental measurements and theoretical calculations. The effects of surface roughness and Au coating thickness of samples on the static electrical contact resistance are discussed.
KW - Electrical contact resistance
KW - In-situ
KW - Line contact
KW - Micro-electromechanical-relay
KW - Minimum contact force
UR - https://www.scopus.com/pages/publications/85061802326
U2 - 10.1109/HOLM.2018.8611715
DO - 10.1109/HOLM.2018.8611715
M3 - 会议稿件
AN - SCOPUS:85061802326
T3 - Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
SP - 366
EP - 372
BT - Electrical Contacts - 2018, Proceedings of the 64th IEEE Holm Conference on Electrical Contacts, Holm 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 64th IEEE Holm Conference on Electrical Contacts, Holm 2018
Y2 - 14 October 2018 through 18 October 2018
ER -