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Investigation of the electronic structure of BiFeO3 epitaxial films by polarized X-ray absorption spectroscopy

  • H. B. Wang
  • , Z. L. Luo
  • , Y. Q. Dong
  • , Z. L. Zhao
  • , Y. J. Yang
  • , Z. H. Chen
  • , M. M. Yang
  • , S. X. Hu
  • , L. Chen
  • , C. Gao
  • University of Science and Technology of China
  • University of California at Berkeley
  • Southern University of Science and Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

To investigate the epitaxial strain effect on local electronic structure of FeO6 octahedron of BiFeO3 epitaxial film, polarization-dependent Fe L23-edge x-ray absorption spectroscopy studies were performed on both tetragonal(T)-like BFO/LAO and rhombohedral(R)-like BFO/STO epitaxial films. Charge transfer multiplet theory based fittings were also performed to reveal the local electronic structure difference. Due to dramatic structural difference caused by epitaxial strain between these two samples, significant electronic structure differences were observed between these two specimens. For BFO/LAO, anisotropic electronic structure appears in vertically-elongated FeO6 octahedron and an additional shift of Fe ion off the central position is suggested. For BFO/STO, electronic structure is almost isotropic.

Original languageEnglish
Title of host publicationAdvanced Functional Materials
EditorsYafang Han, Zhongwei Gu, Qiang Fu
PublisherTrans Tech Publications Ltd
Pages183-187
Number of pages5
ISBN (Electronic)9783038353942
DOIs
StatePublished - 2015
Externally publishedYes
EventChinese Materials Congress, CMC 2014 - Chengdu, China
Duration: 4 Jul 20147 Jul 2014

Publication series

NameMaterials Science Forum
Volume815
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

ConferenceChinese Materials Congress, CMC 2014
Country/TerritoryChina
CityChengdu
Period4/07/147/07/14

Keywords

  • BiFeO
  • Electronic structure
  • Epitaxial film
  • Polarized x-ray absorption spectroscopy

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