Abstract
Nonlinear refraction of a thick sample is investigated using a modified transmittance measurement technique with a phase object. Nonlinear refraction can be investigated using a single-shot beam in this technique, and various optical nonlinearities are investigated. Numerical simulation is obtained by solving the electromagnetic wave equations, and agrees with experimental results.
| Original language | English |
|---|---|
| Article number | 105401 |
| Journal | Journal of Physics B: Atomic, Molecular and Optical Physics |
| Volume | 43 |
| Issue number | 10 |
| DOIs | |
| State | Published - 2010 |
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