@inproceedings{92d6a7c5490149afb83707afcc32da19,
title = "Investigation of kinematics error influence on on-machine measurement for ultra-precision turning",
abstract = "Shift from offline measurement to on-machine measurement (OMM) is urgently needed for closed-loop control for ultra-precision machining processes. OMM can avoid the errors caused by repositioning workpieces and increases the inspection efficiency. In this work, an in-house designed interferometer probe was integrated on a 3-axis ultra-precision diamond turning machine for OMM. However, as the probe is carried on the motion slides, kinematics errors of the machine tool will inevitably affect the OMM results. To investigate the influence of kinematics errors, simulation analysis was performed and the four primary error components in the sensitive measurement direction were measured by capacitance sensors using the reversal method. Finally, an OMM experiment of an optical flat surface was carried out. The results prove that OMM error was dominated by the C axis tilt error EBC with a 2 UPR (undulations per revolution) component along circumferential direction.",
keywords = "Interferometry, Kinematics error, On-machine measurement, Ultra-precision machine tool",
author = "Duo Li and Zhen Tong and Liam Blunt and Fei Ding and Xiangqian Jiang",
note = "Publisher Copyright: {\textcopyright} 2018 CURRAN-CONFERENCE. All rights reserved.; 18th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2018 ; Conference date: 04-06-2018 Through 08-06-2018",
year = "2018",
language = "英语",
isbn = "9780995775121",
series = "European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition, EUSPEN 2018",
publisher = "euspen",
pages = "143--144",
editor = "O. Riemer and Enrico Savio and D. Billington and Leach, \{R. K.\} and D. Phillips",
booktitle = "European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 18th International Conference and Exhibition, EUSPEN 2018",
}