Abstract
An interpenetrating polymer network (IPN) substrate was prepared by dip-pulling a silicon wafer or glass plate into polymer precursors, followed by solidification at room temperature. The nickel ion containing Langmuir-Blodgett (LB) multilayers was subsequently fabricated onto the IPN substrate by a LB technique, and then the nickel ultra-thin films were deposited by chemical reduction. The interfacial reactions, the metal transformations and the non-metal bond types during the film formation were detected by the X-ray photoelectron spectroscopy, atomic force microscope and attenuated total reflection infrared spectroscopy.
| Original language | English |
|---|---|
| Pages (from-to) | 15-20 |
| Number of pages | 6 |
| Journal | Surface and Interface Analysis |
| Volume | 44 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 2012 |
Keywords
- Langmuir-Blodgett technique
- X-ray photoelectron spectroscopy
- interfacial reaction
- interpenetrating polymer network
- nickel
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