Abstract
Optical fiber bonding is a key technique in optoelectronic packaging, and the interfacial microstructure has a significant influence on solder joint reliability. In this work, 80Au20Sn and 52In48Sn solders were chosen for fiber bonding through laser soldering, and a scanning electronic microscope (SEM) equipped with energy dispersive X-ray detector (EDX) was used to investigate the morphology and formation of microstructure at four interfaces between two solders and two metallizations: AuSn/(Au/Ti), AuSn/(Au/Ni), InSn/(Au/Ti) and InSn/(Au/Ni). Results show that a large amount of dendritic pre-eutectic ζ-phase forms at the AuSn/(Au/Ti) interface, while some needle-like (Au, Ni)3Sn2 forms at the AuSn/(Au/Ni) interface, an obviously continuous Au(In, Sn)2 layer forms at the InSn/(Au/Ti) interface and an extremely thin Au(In, Sn)2 layer forms at the InSn/(Au/Ni) interface. Moreover, the continuous Au(In, Sn)2 layer transforms into incontinuous block-like AuIn2 at the InSn/(Au/Ti) interface with the increase of input laser energy.
| Original language | English |
|---|---|
| Pages (from-to) | 174-177 |
| Number of pages | 4 |
| Journal | Cailiao Kexue yu Gongyi/Material Science and Technology |
| Volume | 17 |
| Issue number | 2 |
| State | Published - Apr 2009 |
| Externally published | Yes |
Keywords
- AuSn solder
- InSn solder
- Interfacial Microstructure
- Optical fiber alignment
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