Abstract
The interface structure of deformation-induced martensite and its relation to the stability of martensites in a Ni-Ti-Nb alloy have been studied using high-resolution electron microscopy (HREM) and in-situ TEM observations. HREM observations show that the interface of stress-induced martensite (SIM) is straight and well-defined as well as perfectly coherent. However, the ledges and distorted layers are formed in the interface of SIMs subjected to low deformation strain and the interfacial coherence is damaged. With increasing of deformation strain, the ledges and distorted layers gradually turn into the confused layers and the interfaces of martensite variants completely lose coherence. In-situ TEM observations show that B2 parent phase preferentially nucleates at the interface of deformed and undeformed SIMs variants and grows in a jump manner during reverse transformation. Based on the analysis of reverse transformation characteristics of deformation-induced martensite, the relation of the stability to the interface structure was discussed.
| Original language | English |
|---|---|
| Pages | 93-100 |
| Number of pages | 8 |
| State | Published - 1998 |
| Event | Proceedings of the 1996 International Conference on Displacive Phase Transformations and their Applications in Materials Engineering - Urban, IL, USA Duration: 8 May 1996 → 9 May 1996 |
Conference
| Conference | Proceedings of the 1996 International Conference on Displacive Phase Transformations and their Applications in Materials Engineering |
|---|---|
| City | Urban, IL, USA |
| Period | 8/05/96 → 9/05/96 |
Fingerprint
Dive into the research topics of 'Interface structure and stability of deformation-induced martensite in a Ni-Ti-Nb alloy with wide hysteresis'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver