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Interdiffusion of Al-Ni system enhanced by ultrasonic vibration at ambient temperature

  • Mingyu Li*
  • , Hongjun Ji
  • , Chunqing Wang
  • , Han Sur Bang
  • , Hee Seon Bang
  • *Corresponding author for this work
  • University Town of Shenzhen
  • Harbin Institute of Technology
  • Chosun University

Research output: Contribution to journalArticlepeer-review

Abstract

At ambient temperature, Al-1%Si wire of 25 μm diameter was bonded successfully onto the Au/Ni/Cu pad by ultrasonic wedge bonding technology. Physical process of the bond formation and the interface joining essence were investigated. It is found that the wire was softened by ultrasonic vibration, at the same time, pressure was loaded on the wire and plastic flow was generated in the bonding wire, which promoted the diffusion for Ni into Al. Ultrasonic vibration enhanced the interdiffusion that resulted from the inner defects such as dislocations, vacancies, voids and so on, which ascribed to short circuit diffusion.

Original languageEnglish
Pages (from-to)61-65
Number of pages5
JournalUltrasonics
Volume45
Issue number1-4
DOIs
StatePublished - Dec 2006
Externally publishedYes

Keywords

  • Al-Ni system
  • Effects of ultrasonic
  • Interdiffusion
  • Ultrasonic wedge bonding

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