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Integrated Reconstructive Spectrometer Based on a Si3N4-Si dual-layer Platform

  • Lin Xiao
  • , Qi Sun
  • , Qingbo Yang
  • , Dongpeng Kang*
  • *Corresponding author for this work
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We propose and numerically investigate a dual-layer Si3N4-Si integrated spectrometer with 40 pm resolution spanning the 1500-1600 nm wavelength range. The device is implemented in a 29×29 μm2 footprint with 300 sampling channels.

Original languageEnglish
Title of host publication2025 Asia Communications and Photonics Conference, ACP 2025
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9798350357400
DOIs
StatePublished - 2025
Event2025 Asia Communications and Photonics Conference, ACP 2025 - Jiangsu, China
Duration: 5 Nov 20258 Nov 2025

Publication series

NameAsia Communications and Photonics Conference, ACP
ISSN (Print)2162-108X

Conference

Conference2025 Asia Communications and Photonics Conference, ACP 2025
Country/TerritoryChina
CityJiangsu
Period5/11/258/11/25

Keywords

  • dual-layer
  • high resolution
  • integrated spectrometer
  • microdisk resonator

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