Influence of pulse electromagnetic fields on current-technology microcontrollers

M. P. Gribskii; Ye V. Grigor'ev; A. K. Voitovich; S. A. Zuev; V. V. Starostenko; G. I. Churyumov

doi:10.1615/TelecomRadEng.v66.i19.80

Influence of pulse electromagnetic fields on current-technology microcontrollers

M. P. Gribskii^*
, Ye V. Grigor'ev
, A. K. Voitovich
, S. A. Zuev
, V. V. Starostenko
, G. I. Churyumov

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The results of the experimental investigation of degradation processes in microcontrollers under impact of the pulse electromagnetic fields are analyzed and represented. The dominant causes of their malfunctions are determined. Threshold values of the field when operation failures occur and degradation processes begin, have been obtained. The least stable of all elements of chips as well as the causes and the nature of catastrophic failures have been studied.

Original language	English
Pages (from-to)	1791-1797
Number of pages	7
Journal	Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika)
Volume	66
Issue number	19
DOIs	https://doi.org/10.1615/TelecomRadEng.v66.i19.80
State	Published - 2007
Externally published	Yes

Access to Document

10.1615/TelecomRadEng.v66.i19.80

Cite this

@article{333d9029d3e842459788edd778dec12f,

title = "Influence of pulse electromagnetic fields on current-technology microcontrollers",

abstract = "The results of the experimental investigation of degradation processes in microcontrollers under impact of the pulse electromagnetic fields are analyzed and represented. The dominant causes of their malfunctions are determined. Threshold values of the field when operation failures occur and degradation processes begin, have been obtained. The least stable of all elements of chips as well as the causes and the nature of catastrophic failures have been studied.",

author = "Gribskii, \{M. P.\} and Grigor'ev, \{Ye V.\} and Voitovich, \{A. K.\} and Zuev, \{S. A.\} and Starostenko, \{V. V.\} and Churyumov, \{G. I.\}",

year = "2007",

doi = "10.1615/TelecomRadEng.v66.i19.80",

language = "英语",

volume = "66",

pages = "1791--1797",

journal = "Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika)",

issn = "0040-2508",

publisher = "Begell House Inc.",

number = "19",

}

TY - JOUR

T1 - Influence of pulse electromagnetic fields on current-technology microcontrollers

AU - Gribskii, M. P.

AU - Grigor'ev, Ye V.

AU - Voitovich, A. K.

AU - Zuev, S. A.

AU - Starostenko, V. V.

AU - Churyumov, G. I.

PY - 2007

Y1 - 2007

N2 - The results of the experimental investigation of degradation processes in microcontrollers under impact of the pulse electromagnetic fields are analyzed and represented. The dominant causes of their malfunctions are determined. Threshold values of the field when operation failures occur and degradation processes begin, have been obtained. The least stable of all elements of chips as well as the causes and the nature of catastrophic failures have been studied.

AB - The results of the experimental investigation of degradation processes in microcontrollers under impact of the pulse electromagnetic fields are analyzed and represented. The dominant causes of their malfunctions are determined. Threshold values of the field when operation failures occur and degradation processes begin, have been obtained. The least stable of all elements of chips as well as the causes and the nature of catastrophic failures have been studied.

UR - https://www.scopus.com/pages/publications/38149125446

U2 - 10.1615/TelecomRadEng.v66.i19.80

DO - 10.1615/TelecomRadEng.v66.i19.80

M3 - 文章

AN - SCOPUS:38149125446

SN - 0040-2508

VL - 66

SP - 1791

EP - 1797

JO - Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika)

JF - Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika)

IS - 19

ER -

Influence of pulse electromagnetic fields on current-technology microcontrollers

Abstract

Access to Document

Other files and links

Fingerprint

Cite this