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Industrial fault diagnosis based on few shot learning

  • School of Electronic and Information Engineering

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In fault diagnosis, traditional machine learning methods usually require manual feature selection, which requires higher professional background and multiple attempts. Although deep learning avoids the selection of features, it needs a large amount of data. In industrial systems, it is usually difficult and expensive to obtain fault data, so it is not suitable for the fault diagnosis task with few data. In this paper, we use the idea of Few Shot Learning for fault diagnosis to avoid the difficulty of manual feature selection, and it is suitable for the fault diagnosis field with few samples. For the fault tasks to be diagnosed, this paper uses additional data to obtain prior knowledge. On the basis of the prototype network, we use one-dimensional convolutional neural network to extract the signal features of the fault signals, and complete the final classification with KNN. In order to alleviate the problem of few samples size, we also introduced the method of data enhancement to improve the fault diagnosis rate to a certain extent. The experimental results show that in the case of few samples, proposed few shot learning fault diagnosis method in this paper obtains good diagnosis results.

Original languageEnglish
Title of host publication2021 Global Reliability and Prognostics and Health Management, PHM-Nanjing 2021
EditorsWei Guo, Steven Li
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665401302
DOIs
StatePublished - 2021
Externally publishedYes
Event12th IEEE Global Reliability and Prognostics and Health Management, PHM-Nanjing 2021 - Nanjing, China
Duration: 15 Oct 202117 Oct 2021

Publication series

Name2021 Global Reliability and Prognostics and Health Management, PHM-Nanjing 2021

Conference

Conference12th IEEE Global Reliability and Prognostics and Health Management, PHM-Nanjing 2021
Country/TerritoryChina
CityNanjing
Period15/10/2117/10/21

Keywords

  • Few-shot learning
  • Industrial fault diagnosis
  • Neural network

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