TY - GEN
T1 - Incorporating Semi-Supervised and Positive-Unlabeled Learning for Boosting Full Reference Image Quality Assessment
AU - Cao, Yue
AU - Wan, Zhaolin
AU - Ren, Dongwei
AU - Yan, Zifei
AU - Zuo, Wangmeng
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Full-reference (FR) image quality assessment (IQA) evaluates the visual quality of a distorted image by measuring its perceptual difference with pristine-quality reference, and has been widely used in low-level vision tasks. Pairwise labeled data with mean opinion score (MOS) are required in training FR-IQA model, but is time-consuming and cumbersome to collect. In contrast, unlabeled data can be easily collected from an image degradation or restoration process, making it encouraging to exploit unlabeled training data to boost FR-IQA performance. Moreover, due to the distribution inconsistency between labeled and unlabeled data, outliers may occur in unlabeled data, further increasing the training difficulty. In this paper, we suggest to incorporate semi-supervised and positive-unlabeled (PU) learning for exploiting unlabeled data while mitigating the adverse effect of outliers. Particularly, by treating all labeled data as positive samples, PU learning is leveraged to identify negative samples (i.e., outliers) from unlabeled data. Semi-supervised learning (SSL) is further deployed to exploit positive unlabeled data by dynamically generating pseudo-MOS. We adopt a dual-branch network including reference and distortion branches. Furthermore, spatial attention is introduced in the reference branch to concentrate more on the informative regions, and sliced Wasserstein distance is used for robust difference map computation to address the misalignment issues caused by images recovered by GAN models. Extensive experiments show that our method performs favorably against state-of-the-arts on the benchmark datasets PIPAL, KADID-10k, TID2013, LIVE and CSIQ. The source code and model are available at https://github.com/happycaoyue/JSPL.
AB - Full-reference (FR) image quality assessment (IQA) evaluates the visual quality of a distorted image by measuring its perceptual difference with pristine-quality reference, and has been widely used in low-level vision tasks. Pairwise labeled data with mean opinion score (MOS) are required in training FR-IQA model, but is time-consuming and cumbersome to collect. In contrast, unlabeled data can be easily collected from an image degradation or restoration process, making it encouraging to exploit unlabeled training data to boost FR-IQA performance. Moreover, due to the distribution inconsistency between labeled and unlabeled data, outliers may occur in unlabeled data, further increasing the training difficulty. In this paper, we suggest to incorporate semi-supervised and positive-unlabeled (PU) learning for exploiting unlabeled data while mitigating the adverse effect of outliers. Particularly, by treating all labeled data as positive samples, PU learning is leveraged to identify negative samples (i.e., outliers) from unlabeled data. Semi-supervised learning (SSL) is further deployed to exploit positive unlabeled data by dynamically generating pseudo-MOS. We adopt a dual-branch network including reference and distortion branches. Furthermore, spatial attention is introduced in the reference branch to concentrate more on the informative regions, and sliced Wasserstein distance is used for robust difference map computation to address the misalignment issues caused by images recovered by GAN models. Extensive experiments show that our method performs favorably against state-of-the-arts on the benchmark datasets PIPAL, KADID-10k, TID2013, LIVE and CSIQ. The source code and model are available at https://github.com/happycaoyue/JSPL.
KW - Low-level vision
UR - https://www.scopus.com/pages/publications/85141813909
U2 - 10.1109/CVPR52688.2022.00576
DO - 10.1109/CVPR52688.2022.00576
M3 - 会议稿件
AN - SCOPUS:85141813909
T3 - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
SP - 5841
EP - 5851
BT - Proceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PB - IEEE Computer Society
T2 - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Y2 - 19 June 2022 through 24 June 2022
ER -