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Improving wafer fabrication performance by Hierarchical colored timed Petri-net and SA - Based approach

  • Zhengcai Cao*
  • , Yingtao Zhao
  • , Fei Qiao
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The paper describes an approach to scheduling for semiconductor wafer fabrication. In order to effectively analyze of control for semiconductor wafer fabrication, a Hierarchical colored timed Petri net (HCTPN) modeling technology based on the comprehensive analysis of the semiconductor manufacturing process was proposed. Due to the wide acceptance of priority rules in the wafer fabrication, we proposed a simulated annealing (SA) to search for the optimal combination of a number of priority rules in the HCTPN models. Computational results are presented that our approach constantly generates better solutions compared to those obtained by commonly-used dispatching rules.

Original languageEnglish
Title of host publication2010 8th World Congress on Intelligent Control and Automation, WCICA 2010
Pages4045-4049
Number of pages5
DOIs
StatePublished - 2010
Externally publishedYes
Event2010 8th World Congress on Intelligent Control and Automation, WCICA 2010 - Jinan, China
Duration: 7 Jul 20109 Jul 2010

Publication series

NameProceedings of the World Congress on Intelligent Control and Automation (WCICA)

Conference

Conference2010 8th World Congress on Intelligent Control and Automation, WCICA 2010
Country/TerritoryChina
CityJinan
Period7/07/109/07/10

Keywords

  • Modeling
  • Petri net
  • Scheduling
  • Semiconductor wafer fabricate
  • Simulated annealing

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