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Improved variable EWMA controller design

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The exponentially weighted moving average (EWMA) controller is a popular run-to-run (RtR) control scheme in semiconductor manufacturing because of its effectiveness and simplicity. In this paper we propose an improved variable EWMA controller design method. The optimal discount factor of the EWMA controller is determined by minimizing the mean square error (MSE) of process output at each run. The proposed method overcomes some potential problems of Tseng's method and can be applied to general autoregressive integrated moving average (ARIMA) processes. Simulation examples are given to show the effectiveness of the proposed method.

Original languageEnglish
Title of host publicationProceeding of the 11th World Congress on Intelligent Control and Automation, WCICA 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages4316-4320
Number of pages5
EditionMarch
ISBN (Electronic)9781479958252
DOIs
StatePublished - 2 Mar 2015
Event2014 11th World Congress on Intelligent Control and Automation, WCICA 2014 - Shenyang, China
Duration: 29 Jun 20144 Jul 2014

Publication series

NameProceedings of the World Congress on Intelligent Control and Automation (WCICA)
NumberMarch
Volume2015-March

Conference

Conference2014 11th World Congress on Intelligent Control and Automation, WCICA 2014
Country/TerritoryChina
CityShenyang
Period29/06/144/07/14

Keywords

  • EWMA
  • Run-to-run control
  • Semiconductor manufacturing
  • Variable discount factor

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