TY - GEN
T1 - Improved time-frequency distribution series for ultrasonic nondestructive evaluation
AU - Du, Xiuli
AU - Shen, Yi
PY - 2006
Y1 - 2006
N2 - Time-frequency distribution series (TFDS) is introduced to represent ultrasonic signals, detect and locate defects, because TFDS can effectively decrease the cross-terms with a minimum degradation of the desired properties. Moreover, considering the time-frequency concentration of the time-frequency energy atoms, the improved TFDS reduces the computational complexity, which makes TFDS more practical. Both simulated and experimental ultrasonic signals are represented by TFDS and Wigner-Ville distribution (WVD) and their performance are compared in terms of cross-terms, resolution and the ability to character defects. Results show that TFDS has the advantages of characterizing and localizing defects in ultrasonic nondestructive evaluation.
AB - Time-frequency distribution series (TFDS) is introduced to represent ultrasonic signals, detect and locate defects, because TFDS can effectively decrease the cross-terms with a minimum degradation of the desired properties. Moreover, considering the time-frequency concentration of the time-frequency energy atoms, the improved TFDS reduces the computational complexity, which makes TFDS more practical. Both simulated and experimental ultrasonic signals are represented by TFDS and Wigner-Ville distribution (WVD) and their performance are compared in terms of cross-terms, resolution and the ability to character defects. Results show that TFDS has the advantages of characterizing and localizing defects in ultrasonic nondestructive evaluation.
KW - Defect location
KW - Material characterization
KW - Time-frequency analysis
KW - Time-frequency distribution series
KW - Ultrasonic signal
UR - https://www.scopus.com/pages/publications/36049034913
U2 - 10.1109/IMTC.2006.236813
DO - 10.1109/IMTC.2006.236813
M3 - 会议稿件
AN - SCOPUS:36049034913
SN - 0780393600
SN - 9780780393608
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
SP - 2112
EP - 2115
BT - IMTC'06 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
T2 - IMTC'06 - IEEE Instrumentation and Measurement Technology Conference
Y2 - 24 April 2006 through 27 April 2006
ER -