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Improved PLS focused on key-performance-indicator-related fault diagnosis

  • Shen Yin
  • , Xiangping Zhu*
  • , Okyay Kaynak
  • *Corresponding author for this work
  • Bohai University
  • Harbin Institute of Technology
  • Bogazici University

Research output: Contribution to journalArticlepeer-review

Abstract

Standard partial least squares (PLS) serves as a powerful tool for key performance indicator (KPI) monitoring in large-scale process industry for last two decades. However, the standard approach and its recent modifications still encounter some problems for fault diagnosis related to KPI of the underlying process. To cope with these difficulties, an improved PLS (IPLS) approach is presented in this paper. IPLS is able to decompose the measurable process variables into the KPI-related and unrelated parts, respectively. Based on it, the corresponding test statistics are designed to offer meaningful fault diagnosis information and thus, the corresponding maintenance actions can be further taken to ensure the desired performance of the systems. In order to demonstrate the effectiveness of the proposed approach, a numerical example and Tennessee Eastman (TE) benchmark process are respectively utilized. It can be seen that the proposed approach shows satisfactory results not only for diagnosing KPI-related faults but also for its high fault detection rate.

Original languageEnglish
Article number6873303
Pages (from-to)1651-1658
Number of pages8
JournalIEEE Transactions on Industrial Electronics
Volume62
Issue number3
DOIs
StatePublished - Mar 2015

Keywords

  • Fault diagnosis
  • Tennessee Eastman (TE) process
  • improved partial least squares (IPLS)
  • key performance indicator (KPI)

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