Imaging of microdefects in ZnGeP₂ single crystals by X-ray topography

The contrast from microdefects in ZnGeP₂ crystals is studied. Simulation of images in X-ray topography based on the Borrmann effect is carried out for a model of a coherent inclusion of spherical form in an infinite isotropic matrix. For this simulation, a semi-phenomenological theory of contrast from defects with a slowly changing deformation field is applied. It is shown that the contrast from the inclusion is a complex function, depending on the nature of defect (sign of the deformation of the matrix), the magnitude of the deformation caused by the defect, its depth in the crystal, the modulus of the diffraction vector g and the topography used (reflection or transmission). The most common images are intensity rosettes of double or triple contrast, whose lobes are elongated along the diffraction vector. These are created by inclusions, located near the X-ray exit surface of the sample. Analysis of experimental data shows that the majority of microdefects in ZnGeP₂ revealed by Borrmann method (~96%) show good agreement with proposed model. All the features of the experimental images are explained by the theory. Additionally, the contrast from dislocation loops and from groups of big inclusions which have non-Coulombic deformation fields is observed.