Skip to main navigation Skip to search Skip to main content

How to Improve the Performance of Fast Timing Detector

  • Lishuang Ma*
  • , Sen Qian*
  • , Zhe Ning
  • , Zhigang Wang
  • , Yinghong Zhang
  • , Yao Zhu
  • , Hao Guo
  • , Qi Wu
  • , Shuo Peng
  • , Lingfeng Zhang
  • , Zhile Wang
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • CAS - Institute of High Energy Physics
  • North China University of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

Fast timing detector is widely used for its picosecond (ps)-level timing resolution, such as Photek-PMT210 with about 50 ps at single-photon electron (SPE) mode. The time characteristics of these types of fast timing photodetectors include rise time, fall time, and electron transit time (TT) of the output signal. The test results of fast timing detector are affected by the light 7 source, the electronic device board, the data acquisition (DAQ) system, and so on. In this article, some comparative test results will be shown and discussed on the factors affecting the performance of fast timing detector.

Original languageEnglish
Pages (from-to)2459-2463
Number of pages5
JournalIEEE Transactions on Nuclear Science
Volume68
Issue number10
DOIs
StatePublished - 1 Oct 2021

Keywords

  • Microchannel plate (MCP)-photomultiplier tube (MCP-PMT)
  • silicon photomultiplier (SiPM)
  • transit time (TT) spread

Fingerprint

Dive into the research topics of 'How to Improve the Performance of Fast Timing Detector'. Together they form a unique fingerprint.

Cite this