TY - GEN
T1 - High speed contouring control of biaxial systems based on task polar coordinate frame
AU - Meng, Hao
AU - Lou, Yunjiang
AU - Chen, Jiaying
PY - 2013
Y1 - 2013
N2 - Contouring control based on task coordinate frames (TCF) can improve the contouring performance directly by strengthening the tracking capability along contour-following direction. A novel task polar coordinate frame (TPCF) is proposed for the biaxial system contouring control, based on circular approximation. Compared with the classical TCF using tangent line approximation, TPCF can achieve more accurate contouring error estimation for free-form contours. The controller is designed in TPCF via linearizing the transformed error dynamics which is strong coupling and nonlinear. Different dynamics are assigned to the radial (representing the contour following direction) and the angular (representing the trajectory tracking direction) with a strong emphasis on minimizing the contouring error. Experiments on an XY-stage verified that TPCF based contouring control could decrease the contouring error much more evidently compared with classical TCF based, especially in high speed and/or large curvature cases.
AB - Contouring control based on task coordinate frames (TCF) can improve the contouring performance directly by strengthening the tracking capability along contour-following direction. A novel task polar coordinate frame (TPCF) is proposed for the biaxial system contouring control, based on circular approximation. Compared with the classical TCF using tangent line approximation, TPCF can achieve more accurate contouring error estimation for free-form contours. The controller is designed in TPCF via linearizing the transformed error dynamics which is strong coupling and nonlinear. Different dynamics are assigned to the radial (representing the contour following direction) and the angular (representing the trajectory tracking direction) with a strong emphasis on minimizing the contouring error. Experiments on an XY-stage verified that TPCF based contouring control could decrease the contouring error much more evidently compared with classical TCF based, especially in high speed and/or large curvature cases.
UR - https://www.scopus.com/pages/publications/84881429397
U2 - 10.1109/ICIEA.2013.6566621
DO - 10.1109/ICIEA.2013.6566621
M3 - 会议稿件
AN - SCOPUS:84881429397
SN - 9781467363211
T3 - Proceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
SP - 1583
EP - 1588
BT - Proceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
T2 - 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013
Y2 - 19 June 2013 through 21 June 2013
ER -