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High-resolution electron microscopy study on the substructure of Ti-Ni-Hf B19′ Martensite

  • Y. F. Zheng*
  • , W. Cai
  • , J. X. Zhang
  • , Y. Q. Wang
  • , L. C. Zhao
  • , H. Q. Ye
  • *Corresponding author for this work
  • CAS - Institute of Metal Research
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The substructure of martensite in the Ti36Ni49Hf15 alloy has been investigated by high-resolution electron microscopy (HREM) and discussed within the framework of a phenomenological theoretical analysis. The (001) compound twins and (001) stacking faults were confirmed to be the main substructure inside a martensite variant with some (011) stacking faults infrequently observed. The (001) twinning boundary was straight with some blurred regions and (001) faults existing near the interface. The (001) compound twin alone is shown to be unable to produce the lattice invariant shear necessary for the martensitic transformation.

Original languageEnglish
Pages (from-to)142-147
Number of pages6
JournalMaterials Letters
Volume36
Issue number1-4
DOIs
StatePublished - Jul 1998
Externally publishedYes

Keywords

  • Crystallography
  • Martensite
  • Microstructure
  • Shape memory alloy
  • TiNi Hf
  • Titanium nickle hafnium alloy

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