High precision straightness device based on double-frequency laser interference technique

Hui Zhao; Zhao Bang Pu; Guo Dong Liu

High precision straightness device based on double-frequency laser interference technique

Hui Zhao^*
, Zhao Bang Pu
, Guo Dong Liu

^*Corresponding author for this work

Shanghai Jiao Tong University

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

A high precision straightness standard device based on double-frequency laser interference and edge reverse techniques was presented in this paper, in which the laser wave length was taken as the measuring datum. This device which could get the accuracy over 0.1μm/m under common lab-condition was applied in astronautics calibration laboratory.

Original language	English
Pages (from-to)	637-640
Number of pages	4
Journal	Zhongguo Jiguang/Chinese Journal of Lasers
Volume	28
Issue number	7
State	Published - Jul 2001
Externally published	Yes

Keywords

Double-frequency laser
Measurement
Reverse
Straightness

Cite this

@article{3a4c42318d5645589fa1d60d6773f937,

title = "High precision straightness device based on double-frequency laser interference technique",

abstract = "A high precision straightness standard device based on double-frequency laser interference and edge reverse techniques was presented in this paper, in which the laser wave length was taken as the measuring datum. This device which could get the accuracy over 0.1μm/m under common lab-condition was applied in astronautics calibration laboratory.",

keywords = "Double-frequency laser, Measurement, Reverse, Straightness",

author = "Hui Zhao and Pu, \{Zhao Bang\} and Liu, \{Guo Dong\}",

year = "2001",

month = jul,

language = "英语",

volume = "28",

pages = "637--640",

journal = "Zhongguo Jiguang/Chinese Journal of Lasers",

issn = "0258-7025",

publisher = "Chinese Laser Press",

number = "7",

}

TY - JOUR

T1 - High precision straightness device based on double-frequency laser interference technique

AU - Zhao, Hui

AU - Pu, Zhao Bang

AU - Liu, Guo Dong

PY - 2001/7

Y1 - 2001/7

N2 - A high precision straightness standard device based on double-frequency laser interference and edge reverse techniques was presented in this paper, in which the laser wave length was taken as the measuring datum. This device which could get the accuracy over 0.1μm/m under common lab-condition was applied in astronautics calibration laboratory.

AB - A high precision straightness standard device based on double-frequency laser interference and edge reverse techniques was presented in this paper, in which the laser wave length was taken as the measuring datum. This device which could get the accuracy over 0.1μm/m under common lab-condition was applied in astronautics calibration laboratory.

KW - Double-frequency laser

KW - Measurement

KW - Reverse

KW - Straightness

UR - https://www.scopus.com/pages/publications/0035410175

M3 - 文章

AN - SCOPUS:0035410175

SN - 0258-7025

VL - 28

SP - 637

EP - 640

JO - Zhongguo Jiguang/Chinese Journal of Lasers

JF - Zhongguo Jiguang/Chinese Journal of Lasers

IS - 7

ER -

High precision straightness device based on double-frequency laser interference technique

Abstract

Keywords

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