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High-performance integrated passive technology by advanced SI-GaAs-based fabrication for RF and microwave applications

  • Cong Wang*
  • , Ji Hoon Lee
  • , Nam Young Kim
  • *Corresponding author for this work
  • Kwangwoon University

Research output: Contribution to journalArticlepeer-review

Abstract

In this letter, an advanced SI-GaAs-based manufacturing process is presented for creating high quality, cost effective, and compact size integrated passive devices. Through this advanced process, accurate thin film resistors, high Q spiral inductors, and high yield/ breakdown voltage metal-insulator-metal capacitors can be successfully realized.

Original languageEnglish
Pages (from-to)618-623
Number of pages6
JournalMicrowave and Optical Technology Letters
Volume52
Issue number3
DOIs
StatePublished - Mar 2010
Externally publishedYes

Keywords

  • Breakdown voltage
  • Integrated passive device
  • Metal-insulator-metal capacitor
  • Spiral inductor
  • Thin film resistor

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