Abstract
In this letter, an advanced SI-GaAs-based manufacturing process is presented for creating high quality, cost effective, and compact size integrated passive devices. Through this advanced process, accurate thin film resistors, high Q spiral inductors, and high yield/ breakdown voltage metal-insulator-metal capacitors can be successfully realized.
| Original language | English |
|---|---|
| Pages (from-to) | 618-623 |
| Number of pages | 6 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 52 |
| Issue number | 3 |
| DOIs | |
| State | Published - Mar 2010 |
| Externally published | Yes |
Keywords
- Breakdown voltage
- Integrated passive device
- Metal-insulator-metal capacitor
- Spiral inductor
- Thin film resistor
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