TY - GEN
T1 - Hierarchical Contrastive Learning for Pattern-Generalizable Image Corruption Detection
AU - Feng, Xin
AU - Xu, Yifeng
AU - Lu, Guangming
AU - Pei, Wenjie
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Effective image restoration with large-size corruptions, such as blind image inpainting, entails precise detection of corruption region masks which remains extremely challenging due to diverse shapes and patterns of corruptions. In this work, we present a novel method for automatic corruption detection, which allows for blind corruption restoration without known corruption masks. Specifically, we develop a hierarchical contrastive learning framework to detect corrupted regions by capturing the intrinsic semantic distinctions between corrupted and uncorrupted regions. In particular, our model detects the corrupted mask in a coarse-to-fine manner by first predicting a coarse mask by contrastive learning in low-resolution feature space and then refines the uncertain area of the mask by high-resolution contrastive learning. A specialized hierarchical interaction mechanism is designed to facilitate the knowledge propagation of contrastive learning in different scales, boosting the modeling performance substantially. The detected multi-scale corruption masks are then leveraged to guide the corruption restoration. Detecting corrupted regions by learning the contrastive distinctions rather than the semantic patterns of corruptions, our model has well generalization ability across different corruption patterns. Extensive experiments demonstrate following merits of our model: 1) the superior performance over other methods on both corruption detection and various image restoration tasks including blind inpainting and watermark removal, and 2) strong generalization across different corruption patterns such as graffiti, random noise or other image content. Codes and trained weights are available at https://github.com/xyfJASON/HCL.
AB - Effective image restoration with large-size corruptions, such as blind image inpainting, entails precise detection of corruption region masks which remains extremely challenging due to diverse shapes and patterns of corruptions. In this work, we present a novel method for automatic corruption detection, which allows for blind corruption restoration without known corruption masks. Specifically, we develop a hierarchical contrastive learning framework to detect corrupted regions by capturing the intrinsic semantic distinctions between corrupted and uncorrupted regions. In particular, our model detects the corrupted mask in a coarse-to-fine manner by first predicting a coarse mask by contrastive learning in low-resolution feature space and then refines the uncertain area of the mask by high-resolution contrastive learning. A specialized hierarchical interaction mechanism is designed to facilitate the knowledge propagation of contrastive learning in different scales, boosting the modeling performance substantially. The detected multi-scale corruption masks are then leveraged to guide the corruption restoration. Detecting corrupted regions by learning the contrastive distinctions rather than the semantic patterns of corruptions, our model has well generalization ability across different corruption patterns. Extensive experiments demonstrate following merits of our model: 1) the superior performance over other methods on both corruption detection and various image restoration tasks including blind inpainting and watermark removal, and 2) strong generalization across different corruption patterns such as graffiti, random noise or other image content. Codes and trained weights are available at https://github.com/xyfJASON/HCL.
UR - https://www.scopus.com/pages/publications/85185867441
U2 - 10.1109/ICCV51070.2023.01109
DO - 10.1109/ICCV51070.2023.01109
M3 - 会议稿件
AN - SCOPUS:85185867441
T3 - Proceedings of the IEEE International Conference on Computer Vision
SP - 12042
EP - 12051
BT - Proceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Y2 - 2 October 2023 through 6 October 2023
ER -