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GLaMa: Joint Spatial and Frequency Loss for General Image Inpainting

  • Harbin Institute of Technology
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The purpose of image inpainting is to recover scratches and damaged areas using context information from remaining parts. In recent years, thanks to the resurgence of convolutional neural networks (CNNs), image inpainting task has made great breakthroughs. However, most of the work consider insufficient types of mask, and their performance will drop dramatically when encountering unseen masks. To combat these challenges, we propose a simple yet general method to solve this problem based on the LaMa image inpainting framework [35], dubbed GLaMa. Our proposed GLaMa can better capture different types of missing information by using more types of masks. By incorporating more degraded images in the training phase, we can expect to enhance the robustness of the model with respect to various masks. In order to yield more reasonable results, we further introduce a frequency-based loss in addition to the traditional spatial reconstruction loss and adversarial loss. In particular, we introduce an effective reconstruction loss both in the spatial and frequency domain to reduce the chessboard effect and ripples in the reconstructed image. Extensive experiments demonstrate that our method can boost the performance over the original LaMa method for each type of mask on FFHQ [18], ImageNet [7], Places2 [42] and WikiArt [28] dataset. The proposed GLaMa was ranked first in terms of PSNR, LPIPS [39] and SSIM [34] in the NTIRE 2022 Image Inpainting Challenge Track 1 Unsupervised [27].

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
PublisherIEEE Computer Society
Pages1300-1309
Number of pages10
ISBN (Electronic)9781665487399
DOIs
StatePublished - 2022
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States
Duration: 19 Jun 202224 Jun 2022

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2022-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2224/06/22

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