Generation of test sequences for micro-satellite based on T-timed discrete Petri nets model

The maps between T-timed discrete Petri nets (TTDPN) and test object were established through analyzing the composition of test object in the micro-satellite test system. TTDPN description of the test object was given. TTDPN's matrix expression was proposed, and the properties between relation matrix and TTDPN model were proved. Based on the micro-satellite TTDPN model, the dynamic generation algorithm of test sequences was designed to solve the low efficiency problem of the test sequence in existing micro satellites test system. In order to verify the validation and efficiency of the algorithm, the comparison simulation between this algorithm and traditional test sequences generation algorithm was made under the same micro-satellite model. The results show that the algorithm can generate the test sequences dynamically according to the user's requirement, and can meet the high reliability requirement of micro satellite test system.