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Fully convolutional networks for surface defect inspection in industrial environment

  • Zhiyang Yu
  • , Xiaojun Wu*
  • , Xiaodong Gu
  • *Corresponding author for this work
  • Harbin Institute of Technology Shenzhen
  • Shenzhen Key Laboratory for Advanced Motion Control and Modern Automation Equipment

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we propose a reusable and high-efficiency two-stage deep learning based method for surface defect inspection in industrial environment. Aiming to achieve trade-offs between efficiency and accuracy simultaneously, our method makes a novel combination of a segmentation stage (stage1) and a detection stage (stage2), which are consisted of two fully convolutional networks (FCN) separately. In the segmentation stage we use a lightweight FCN to make a spatially dense pixel-wise prediction to inference the area of defect coarsely and quickly. Those predicted defect areas act as the initialization of stage2, guiding the process of detection to refine the segmentation results. We also use an unusual training strategy: training with the patches cropped from the images. Such strategy has greatly utility in industrial inspection where training data may be scarce. We will validate our findings by analyzing the performance obtained on the dataset of DAGM 2007.

Original languageEnglish
Title of host publicationComputer Vision Systems - 11th International Conference, ICVS 2017, Revised Selected Papers
EditorsMarkus Vincze, Haoyao Chen, Ming Liu
PublisherSpringer Verlag
Pages417-426
Number of pages10
ISBN (Print)9783319683447
DOIs
StatePublished - 2017
Externally publishedYes
Event11th International Conference on Computer Vision Systems, ICVS 2017 - Shenzhen, China
Duration: 10 Jul 201713 Jul 2017

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume10528 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference11th International Conference on Computer Vision Systems, ICVS 2017
Country/TerritoryChina
CityShenzhen
Period10/07/1713/07/17

Keywords

  • Fully convolutional networks
  • Segmentation
  • Surface defect inspection

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