Abstract
In this paper, a simple and feasible method to fabricate a Ni-nanodot mask on a silicon substrate is reported. Without using a high-cost rapid thermal annealing (RTA) furnace, this method was based on the conventional thermal annealing of a Ni layer deposited on a Si substrate. In addition, the influences of the Ni-layer thickness and annealing conditions on the size and density of the Ni nanodots were systematically investigated. The as-prepared Ni nanodots were well distributed, having a uniform size and a regular spherical shape. Moreover, a Si nanopillar array could be fabricated by inductively coupled plasma (ICP) etching using the as-obtained Ni-nanodot array mask.
| Original language | English |
|---|---|
| Pages (from-to) | 119-123 |
| Number of pages | 5 |
| Journal | Materiali in Tehnologije |
| Volume | 52 |
| Issue number | 2 |
| DOIs | |
| State | Published - 2018 |
| Externally published | Yes |
Keywords
- Conventional thermal annealing
- ICP
- Ni nanodot
- Si nanopillar
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