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Fabrication of uniform and compact ZnO thin films by langmuir-blodgett method

  • Qian Feng
  • , Dongyan Tang*
  • , Zaiqian Yu
  • , Shuo Gu
  • , Enying Jiang
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • George Washington University

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, stearic acid/Zn2+ monolayer were formed at air-water interface and then multilayers were deposited onto a glass slide by Langmuir-Blodgett method. After annealing at 300°C for 0.25 h and 550°C for 2 h, ZnO thin films were fabricated. The optimized parameters for monolayer formation and multilayers deposition were determined by the surface pressure-surface area (Π-A) isotherm and transfer ratio (t.r.), respectively. The results of X-ray diffraction showed that multilayers changed into ZnO thin films with hexagonal structure and of high crystallization after annealing at high temperature. The observation of SEM images indicated that ZnO thin films had a uniform and flat surface with compact arrangement.

Original languageEnglish
Article number1350047
JournalSurface Review and Letters
Volume20
Issue number5
DOIs
StatePublished - Oct 2013

Keywords

  • Langmuir-Blodgett (LB) method
  • hexagonal wurtzite structure
  • thin films
  • zinc oxide

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