Abstract
In this paper, stearic acid/Zn2+ monolayer were formed at air-water interface and then multilayers were deposited onto a glass slide by Langmuir-Blodgett method. After annealing at 300°C for 0.25 h and 550°C for 2 h, ZnO thin films were fabricated. The optimized parameters for monolayer formation and multilayers deposition were determined by the surface pressure-surface area (Π-A) isotherm and transfer ratio (t.r.), respectively. The results of X-ray diffraction showed that multilayers changed into ZnO thin films with hexagonal structure and of high crystallization after annealing at high temperature. The observation of SEM images indicated that ZnO thin films had a uniform and flat surface with compact arrangement.
| Original language | English |
|---|---|
| Article number | 1350047 |
| Journal | Surface Review and Letters |
| Volume | 20 |
| Issue number | 5 |
| DOIs | |
| State | Published - Oct 2013 |
Keywords
- Langmuir-Blodgett (LB) method
- hexagonal wurtzite structure
- thin films
- zinc oxide
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