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Fabrication of broadband antireflection coating based on ion beam sputtering deposition technique with time-power monitoring

  • Huasong Liu
  • , Zhanshan Wang
  • , Yiqin Ji*
  • , Zhengxiang Shen
  • , Bin Ma
  • , Xinbin Cheng
  • , Hongfei Jiao
  • , Deying Chen
  • , Dandan Liu
  • , Hongjun Song
  • *Corresponding author for this work
  • Tongji University
  • Tianjin Jinhang Institute of Technical Physics
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

With the development of optical systems for multi-wavelength and wide-angle range, there is a requirement of the antireflection coating with wide-spectrum and wide-incidence angle range. In this paper, the substrate is super-smooth ZF6 (rms less than 0.6 nm) glass and HfO2 and SiO2 are selected as high index and low index materials, respectively. The broadband antireflection coating is designed, for wavelength form 600 to 1200 nm and incidence angle of 0° to 30°. The influences of refractive index inhomogeneity, error of refractive index and error of layer physical thickness on its transmittance are analyzed. Ion beam sputtering deposition of time-power thickness monitoring is used to manufacture the antireflection coating and the each layer thickness systematic correction coefficients are obtained by numerical optimization method from transmittance spectra. The average transmittance of the manufactured broadband antireflection coating achieves above 99%.

Original languageEnglish
Pages (from-to)407-411
Number of pages5
JournalQiangjiguang Yu Lizishu/High Power Laser and Particle Beams
Volume23
Issue number2
DOIs
StatePublished - Feb 2011

Keywords

  • Broadband antireflection coating
  • Correction of layer thickness
  • Ion beam sputtering deposition
  • Time-power monitoring

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