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Fabrication and characterization of nano/amorphous dual-phase FINEMET microwires

  • H. Wang
  • , F. X. Qin
  • , D. W. Xing
  • , F. Y. Cao
  • , H. X. Peng
  • , J. F. Sun*
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • University of Bristol

Research output: Contribution to journalArticlepeer-review

Abstract

A nano/amorphous dual-phase FINEMET microwire was fabricated directly from molten alloy without any interstage annealing by a home-built melt extraction technique (MET). The microstructure, mechanical and pronounced electromagnetic interference shielding (EMI) effectiveness of this dual-phase microwire has been systematically evaluated. The structural analysis reveals that the as-cast FINEMET microwire consists of two distinct structures, i.e., amorphous and nanocrystalline phase due to their different cooling characteristics. Compared with other reported FINEMET alloys, the extracted microwire exhibits a superior high tensile strength of 1800 MPa. These nanocrystals enabled dual-phase microwires also exhibit large EMI SE values in the frequency range of 8-12 GHz (X-band) due to the multiple magnetic loss mechanisms associated with their intrinsic structural characteristics. The combination of excellent mechanical properties and electromagnetic properties make this kind of melt-extracted dual-phase FINEMET microwire promising for a range of structure and multifunctional applications.

Original languageEnglish
Pages (from-to)1483-1490
Number of pages8
JournalMaterials Science and Engineering: B
Volume178
Issue number20
DOIs
StatePublished - 2013
Externally publishedYes

Keywords

  • Amorphous microwire
  • EMI shielding
  • Melt extraction
  • Rapid solidification

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