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Exploratory research on off-line diagnosis method of ion beam profile

  • Zhen Yang*
  • , Jidong Long
  • , Chaohui Lan
  • , Jie Li
  • , Ping Liu
  • , Jinshui Shi
  • *Corresponding author for this work
  • China Academy of Engineering Physics

Research output: Contribution to journalArticlepeer-review

Abstract

A novel off-line diagnosis method for ion beams of the sealed tube neutron generator is introduced, which is based on secondary ion mass spectrometry (SIMS). The method has high resolution and can provide intensity distribution of ion beam profile and ion composition. The feasibility of the method was analyzed and discussed by numerical simulation, and verified by experiment. The preliminary experimental results indicate the hydrogen distribution and titanium distribution. This method can be used to diagnose the ion beam profile for the sealed tube neutron generator, and can provide confirmation and complement for other diagnostic methods.

Original languageEnglish
Article number044001
JournalQiangjiguang Yu Lizishu/High Power Laser and Particle Beams
Volume26
Issue number4
DOIs
StatePublished - 2014
Externally publishedYes

Keywords

  • Ion beam profile
  • Sealed tube neutron generator
  • Secondary ion mass spectrometry
  • Vacuum arc ion source

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