TY - GEN
T1 - Experiments research on ocean surface wave detecting using streak tube imaging lidar
AU - Sun, Jianfeng
AU - Gao, Jian
AU - Wei, Jingsong
AU - Wang, Qi
PY - 2010
Y1 - 2010
N2 - Synthetic Aperture Radar (SAR) can acquire the ocean wave spectrum in the wide-range area, and it can recognize the complicated space structure of the ocean wave. However, because the wavelength of SAR is long, its space resolution is not enough to analyze the micro-scale wave of the ocean surface. In the paper, Streak Tube Imaging Lidar (STIL) is presented firstly to collect the 4-D image (3-D range image + 1-D intensity image) of the ocean surface wave, which has high space resolution and range accuracy. Through analyzing the 4-D image, the variance of height and coarseness of the small-scale wave can be computed. Therefore, the micro-changes of wave are obtained. The experiments were performed in Yellow Sea, China. The results state that STIL can collect the 4-D images of the ocean wave with high accuracy, which can be used to analyze the micro-scale wave.
AB - Synthetic Aperture Radar (SAR) can acquire the ocean wave spectrum in the wide-range area, and it can recognize the complicated space structure of the ocean wave. However, because the wavelength of SAR is long, its space resolution is not enough to analyze the micro-scale wave of the ocean surface. In the paper, Streak Tube Imaging Lidar (STIL) is presented firstly to collect the 4-D image (3-D range image + 1-D intensity image) of the ocean surface wave, which has high space resolution and range accuracy. Through analyzing the 4-D image, the variance of height and coarseness of the small-scale wave can be computed. Therefore, the micro-changes of wave are obtained. The experiments were performed in Yellow Sea, China. The results state that STIL can collect the 4-D images of the ocean wave with high accuracy, which can be used to analyze the micro-scale wave.
KW - Micro-scale wave
KW - Ocean surface wave
KW - Remote sensing
KW - Streak tube imaging lidar
UR - https://www.scopus.com/pages/publications/78650014103
U2 - 10.1109/RCSLPLT.2010.5615344
DO - 10.1109/RCSLPLT.2010.5615344
M3 - 会议稿件
AN - SCOPUS:78650014103
SN - 9781424455133
T3 - 2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010
SP - 228
EP - 231
BT - 2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010
T2 - 2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser Technology, RCSLPLT/ASOT 2010
Y2 - 28 July 2010 through 1 August 2010
ER -