TY - GEN
T1 - Experimental Study on SEL of a COTS 3D NAND Flash Memory and SEL Protection
AU - Zheng, Xuesong
AU - Wang, Yuhang
AU - Mo, Rigen
AU - Wei, Zhichao
AU - Mei, Bo
AU - Liu, Chaoming
AU - Huo, Mingxue
AU - Xiao, Liyi
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - In this work, we studied the Single Event Latch-up (SEL) effect of a Commercial Off-The-Shelf (COTS) 3D charge trap NAND Flash memory by using heavy ion accelerator. It is found that the SEL effect of the 3D NAND Flash is very sensitive. Through experimental research, we located the SEL sensitive area is the periphery. We designed a SEL protection circuit which is resistant to radiation, and verified the effectiveness of the SEL protection. This approach allows the use of COTS components in space, reducing costs while providing protection against critical SEL effects without special radiation hardening techniques.
AB - In this work, we studied the Single Event Latch-up (SEL) effect of a Commercial Off-The-Shelf (COTS) 3D charge trap NAND Flash memory by using heavy ion accelerator. It is found that the SEL effect of the 3D NAND Flash is very sensitive. Through experimental research, we located the SEL sensitive area is the periphery. We designed a SEL protection circuit which is resistant to radiation, and verified the effectiveness of the SEL protection. This approach allows the use of COTS components in space, reducing costs while providing protection against critical SEL effects without special radiation hardening techniques.
KW - Commercial Off-The-Shelf
KW - NAND flash
KW - single event latch-up
UR - https://www.scopus.com/pages/publications/105010199771
U2 - 10.1109/ICREED65908.2025.11036248
DO - 10.1109/ICREED65908.2025.11036248
M3 - 会议稿件
AN - SCOPUS:105010199771
T3 - 2025 6th International Conference on Radiation Effects of Electronic Devices, ICREED 2025
BT - 2025 6th International Conference on Radiation Effects of Electronic Devices, ICREED 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 6th International Conference on Radiation Effects of Electronic Devices, ICREED 2025
Y2 - 16 April 2025 through 18 April 2025
ER -