Skip to main navigation Skip to search Skip to main content

Experimental study of inspection on SiC coated high-temperature alloy plates with defects using pulsed thermographic technique

  • Qingju Tang*
  • , Junyan Liu
  • , Yang Wang
  • , Sun Hao
  • , Lingjiang Chen
  • *Corresponding author for this work
  • School of Mechatronics Engineering, Harbin Institute of Technology
  • Heilongjiang University of Science and Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The pulsed thermographic technique was used to detect flat-bottomed hole defects in SiC coated high-temperature alloy plates. Temperature-time Logarithm Fitting Method (TtLFM), Principal Component Analysis (PCA) and Pulsed Phase Thermography (PPT) were used to extract the characteristic information of the thermal wave signal generated by thermal pulse. It is found that PCA algorithm is available for analyzing the thermal wave signal generated by thermal pulse due to higher signal-noise ratio. Experiments were performed to investigate the effect on the thermal contrast by the pulse intensity, frame rate and analysis moment, respectively. Experimental results show that larger pulse intensity and frame rate are benefit to get larger thermal contrast thermogram, and optimal analysis moment selected is helpful to detect the defects of SiC coated high-temperature alloy plates using pulsed thermographic technique.

Original languageEnglish
Pages (from-to)21-27
Number of pages7
JournalInfrared Physics and Technology
Volume57
DOIs
StatePublished - 2013
Externally publishedYes

Keywords

  • Flat-bottomed hole defects
  • High-temperature alloy plates
  • Principal component analysis
  • Pulsed thermography

Fingerprint

Dive into the research topics of 'Experimental study of inspection on SiC coated high-temperature alloy plates with defects using pulsed thermographic technique'. Together they form a unique fingerprint.

Cite this