@inproceedings{be33fed6eaca4c979dfca15ac334d82c,
title = "Experimental Investigation of the Failure Mechanism for Power Connectors under Hot-Swapping Conditions",
abstract = "The hot-swapping capability of connectors is demanded for the new designed power distribution unit, but the accumulated mechanical wear and arc erosion extremely limit its reliability and electrical lifespan. In this work, a test apparatus is specially designed to simulate hot-swapping operations and collect the transient variations in contact voltage drop, arcing duration and normal load force. The variation trends of stable contact voltage drop and contact a-spot temperature are systematically analyzed under 50V/25A load conditions. Furthermore, effects of insertion speed and normal load force on the electrical lifespan are investigated experimentally. Finally, it is determined that the wear-induced surface deterioration exacerbates arcing behavior, meanwhile the high temperatures generated by arcing further accelerate material loss and oxidation. The direct consequence is the formation of irreversible insulating oxide layers and structural damage, ultimately leading to open-circuit failure.",
keywords = "arc erosion, failure mechanism, hot-swapping, mechanical wear, power connector",
author = "Chang Sun and Chao Zhang and Wanbin Ren",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 70th IEEE Holm Conference on Electrical Contacts, HOLM 2025 ; Conference date: 15-10-2025 Through 22-10-2025",
year = "2025",
doi = "10.1109/HLM51652.2025.11278364",
language = "英语",
series = "Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Electrical Contacts 2025 - Proceedings of the 70th IEEE Holm Conference on Electrical Contacts, HOLM 2025",
address = "美国",
}