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Evidences of VO, VZn, and Oi defects as the green luminescence origins in ZnO

  • Jinpeng Lv*
  • , Chundong Li
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

In this Letter, by employing a combination of typical treatments and sensitive defect characterization, we discriminate between the roles of different kinds of intrinsic defects in ZnO. Thereby, we offer convincing experimental evidence that the green luminescence can originate from V O, VZn, and Oi-related defects, corresponding to the 2.48 eV, 2.35 eV, and 2.26 eV emissions, respectively. The green emission peaks are found to be dependent on the relative concentration of these defect centers.

Original languageEnglish
Article number232114
JournalApplied Physics Letters
Volume103
Issue number23
DOIs
StatePublished - 2 Dec 2013
Externally publishedYes

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