Abstract
Pb0.99Nb0.02(Zr0.85Sn0.13Ti0.02)O3 (PNZST) antiferroelectric (AFE) thick films are successfully deposited on silicon-based Pt and LaNiO3 electrodes by a sol-gel method. The coexistence of ferroelectric (FE) and AFE phases are revealed in PNZST films by XRD, electric-induced hysteresis loops, dielectric, and leakage current properties. Comparing with PNZST/Pt film, larger recoverable energy density and efficiency are obtained in PNZST/LaNiO3 film due to the lower FE phase proportion. It is analyzed and demonstrated by a thermodynamic model of AFE and FE coexistence system. In addition, the fatigue behaviors of both AFE films are also affected by the proportion of the coexisting FE phase. PNZST/LaNiO3 film exhibits good fatigue resistance on energy storage even after 1010 switching cycles, which is attractive to pulsed power applications.
| Original language | English |
|---|---|
| Pages (from-to) | 154-161 |
| Number of pages | 8 |
| Journal | International Journal of Applied Ceramic Technology |
| Volume | 18 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Jan 2021 |
| Externally published | Yes |
Keywords
- antiferroelectric
- electrodes
- thermodynamics
- thick films
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