Skip to main navigation Skip to search Skip to main content

Embedded laser profile measurement based on Zynq

  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper discusses on the process about how to design a laser measuring instrument based on embedded system. For that, Zynq-7000 is chosen as the system hardware platform that incorporates a dual core ARM Cortex-A9 based Processing System (PS) and Xilinx Programmable Logic (PL) in a single device, which is used as the data acquisition controller parts and integrated controller in this design. Then the real-time image is displayed on the display by HDMI interface. The whole measuring process are as follows, firstly we capture the original image of the laser bar on the surface of the measured object by a Gige camera which is controlled by ARM Cortex-A9 and then transfer image to Programmable Logic which is another part of Zynq for preprocessing the image. And then the preprocessed image data is transferred back to ARM again and used to calculate the image contour based on threshold-weighted centroid algorithm. Finally we will optimize structure parameters calibration for the precision. At the end of the paper, contour data is used to reconstruct the 3D image, and the measurement error is also evaluated. Finally, the embedded laser profile measurement system with the working range of ±5mm, the measurement accuracy achieved ±5μm and real-time processing speed reached 30 frame/second is realized.

Original languageEnglish
Title of host publication1st International Conference on Electronics Instrumentation and Information Systems, EIIS 2017
EditorsJun-Bao Li
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-5
Number of pages5
ISBN (Electronic)9781538608432
DOIs
StatePublished - 2 Jul 2017
Event1st International Conference on Electronics Instrumentation and Information Systems, EIIS 2017 - Harbin, China
Duration: 3 Jun 20175 Jun 2017

Publication series

Name1st International Conference on Electronics Instrumentation and Information Systems, EIIS 2017
Volume2018-January

Conference

Conference1st International Conference on Electronics Instrumentation and Information Systems, EIIS 2017
Country/TerritoryChina
CityHarbin
Period3/06/175/06/17

Keywords

  • ZYNQ
  • embedded system
  • image processing
  • profile measurement

Fingerprint

Dive into the research topics of 'Embedded laser profile measurement based on Zynq'. Together they form a unique fingerprint.

Cite this