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Electron beam introduced metallic nanowires growth

  • Zhichao Chen
  • , Zhan Yang*
  • , Tao Chen
  • , Lining Sun
  • , Toshio Fukuda
  • *Corresponding author for this work
  • Soochow University
  • Nagoya University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presented a method of growing metallic nanowires by using electron beam technology under scanning electron microscopy (SEM). The metallic nanoparticles were dispersed evenly on Indium-Tin Oxide (ITO) by the spin coater. The ITO sample was experimentally prepared by the spin coating technique. The electron beam was focused on a metallic nano particle inside SEM, which were dispersed on the ITO. The growth of metallic nanowires was controlled by the movement of the electron beam. The method this paper presented can be employed for different kinds of metallic and can be used to fabricate metallic nanowires with different length.

Original languageEnglish
Title of host publication16th International Conference on Nanotechnology - IEEE NANO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages26-29
Number of pages4
ISBN (Electronic)9781509039142
DOIs
StatePublished - 21 Nov 2016
Externally publishedYes
Event16th IEEE International Conference on Nanotechnology - IEEE NANO 2016 - Sendai, Japan
Duration: 22 Aug 201625 Aug 2016

Publication series

Name16th International Conference on Nanotechnology - IEEE NANO 2016

Conference

Conference16th IEEE International Conference on Nanotechnology - IEEE NANO 2016
Country/TerritoryJapan
CitySendai
Period22/08/1625/08/16

Keywords

  • Electron Beam
  • Nano Manipulation
  • Nanowire Growth

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