Abstract
Electromechanical instability may occur in dielectric elastomer films due to the coupling between mechanical forces and electric fields. According to Zhao and Suo [Appl. Phys. Lett. 91, 061921 (2007)], free-energy in any form, which consists of elastic strain energy and electric energy, can be used to analyze the electromechanical stability of dielectric elastomer. By taking the permittivity as a variable depending on the deformation in a free energy function, a relationship is established among critical nominal electric field, critical real electric field, nominal stress, and principal stretch ratios. The accurate expressions of these parameters are presented for a special equal biaxial stretch case. All the results obtained by utilizing the single material constant neo-Hookean elastic strain energy model coincide with the conclusions by Zhao and Suo.
| Original language | English |
|---|---|
| Article number | 211901 |
| Journal | Applied Physics Letters |
| Volume | 94 |
| Issue number | 21 |
| DOIs | |
| State | Published - 2009 |
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