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Electrical characteristics of CuS/ZnO PN heterojunction

  • Xuemin Qian
  • , Jianxing Fang
  • , Yinglin Song*
  • *Corresponding author for this work
  • Soochow University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A large area of N-ZnO/P-CuS junction arrays on silicon wafer is successfully fabricated by the method of layer-by-layer deposition cycle. The thicknesses of CuS shell are tuned by controlling the times of layer-by-layer deposition cycle. Three samples with different CuS shell thicknesses are fabricated and their J-V characteristics show good rectification behavior. The threshold voltages are about 2.5 V at the voltage scans of ± 3 V. The field emission properties of three samples are inveatigated. The turn-on fields of three samples are 6.15 V/μm, 8.75 V/μm, and 10.59 V/μm, respectively. The threshold fields of three samples are 10.46 V/μm, 13.71 V/μm, and 15.2 V/μm, respectively.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2009 - Material and Device Technology for Sensors
DOIs
StatePublished - 2009
Externally publishedYes
EventInternational Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors - Beijing, China
Duration: 17 Jun 200919 Jun 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7381
ISSN (Print)0277-786X

Conference

ConferenceInternational Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors
Country/TerritoryChina
CityBeijing
Period17/06/0919/06/09

Keywords

  • Field emission
  • Layer-by-layer
  • Nanorod arrays

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