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Efficient Test-Time Adaptation of Vision-Language Models

  • Adilbek Karmanov
  • , Dayan Guan
  • , Shijian Lu*
  • , Abdulmotaleb El Saddik
  • , Eric Xing
  • *Corresponding author for this work
  • Mohamed Bin Zayed University of Artificial Intelligence
  • Nanyang Technological University
  • University of Ottawa
  • Carnegie Mellon University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Test-time adaptation with pre-trained vision-language models has attracted increasing attention for tackling distribution shifts during the test time. Though prior studies have achieved very promising performance, they in-volve intensive computation which is severely unaligned with test-time adaptation. We design TDA, a training-free dynamic adapter that enables effective and efficient test-time adaptation with vision-language models. TDA works with a lightweight key-value cache that maintains a dy-namic queue with few-shot pseudo labels as values and the corresponding test-sample features as keys. Leveraging the key-value cache, TDA allows adapting to test data gradually via progressive pseudo label refinement which is super-efficient without incurring any backpropagation. In addition, we introduce negative pseudo labeling that alleviates the adverse impact of pseudo label noises by assigning pseudo labels to certain negative classes when the model is uncertain about its pseudo label predictions. Extensive experiments over two benchmarks demonstrate TDA's superior effectiveness and efficiency as compared with the state-of-the-art. The code has been released in https://kdiaaa.github.io/tda/

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
PublisherIEEE Computer Society
Pages14162-14171
Number of pages10
ISBN (Electronic)9798350353006
DOIs
StatePublished - 2024
Externally publishedYes
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024 - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
Country/TerritoryUnited States
CitySeattle
Period16/06/2422/06/24

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