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Efficient Random-Keys PSO for Industrial Inspection Scheduling with Shared Robot Constraints

  • Ziang Chen
  • , Chongrui Fan
  • , Lekai Gong
  • , Kai Li
  • , Wu Wang
  • , Jiaxin Zhang
  • , Hao Wang
  • , Hao Luo*
  • *Corresponding author for this work
  • Harbin Institute of Technology
  • Ltd.

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In practical inspection lines, throughput is often constrained by the interaction between test stations and a shared robot rather than by station processing times alone. The line considered in this paper contains two parallel detection benches for tray jobs and a two-stage rotary line for rotary-part jobs. In addition, the released task list begins with an urgent block that must stay unchanged, so only the remaining suffix is available for resequencing. To handle this setting, we combine an event-driven simulator with particle swarm optimization (PSO). The simulator tracks robot send, transfer, and return actions explicitly, and it keeps Rotary 2 occupied until the corresponding return action is finished. The PSO search is carried out on a random-keys encoding of the non-urgent suffix, which preserves the urgentprefix rule by construction. On the studied instance, the best schedule produced by the proposed method reduces makespan from 80,211.99 s under FIFO to 41,775.83 s, i.e., by 47.92%, while also increasing robot utilization and lowering average waiting time. The results show that a lightweight simulation-based PSO can produce effective schedules for inspection lines with coupled robot and blocking constraints.

Original languageEnglish
Title of host publicationProceeding
Subtitle of host publicationECIS 2026 - 2026 IEEE 3rd International Conference on Electronics, Communications and Intelligent Science
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331563271
DOIs
StatePublished - 2026
Event3rd IEEE International Conference on Electronics, Communications and Intelligent Science, ECIS 2026 - Nanning, China
Duration: 22 May 202624 May 2026

Publication series

NameProceeding: ECIS 2026 - 2026 IEEE 3rd International Conference on Electronics, Communications and Intelligent Science

Conference

Conference3rd IEEE International Conference on Electronics, Communications and Intelligent Science, ECIS 2026
Country/TerritoryChina
CityNanning
Period22/05/2624/05/26

Keywords

  • blocking constraint
  • event-driven simulation
  • inspection scheduling
  • particle swarm optimization

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