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Efficient joint 2D and 3D palmprint matching with alignment refinement

  • Wei Li*
  • , Lei Zhang
  • , David Zhang
  • , Guangming Lu
  • , Jingqi Yan
  • *Corresponding author for this work
  • Hong Kong Polytechnic University
  • Shanghai Jiao Tong University
  • Harbin Institute of Technology Shenzhen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Palmprint verification is a relatively new but promising personal authentication technique for its high accuracy and fast matching speed. Two dimensional (2D) palmprint recognition has been well studied in the past decade, and recently three dimensional (3D) palmprint recognition techniques were also proposed. The 2D and 3D palmprint data can be captured simultaneously and they provide different and complementary information. 3D palmprint contains the depth information of the palm surface, while 2D palmprint contains plenty of textures. How to efficiently extract and fuse the 2D and 3D palmprint features to improve the recognition performance is a critical issue for practical palmprint systems. In this paper, an efficient joint 2D and 3D palmprint matching scheme is proposed. The principal line features and palm shape features are extracted and used to accurately align the palmprint, and a couple of matching rules are defined to efficiently use the 2D and 3D features for recognition. The experiments on a 2D+3D palmprint database which contains 8000 samples show that the proposed scheme can greatly improve the performance of palmprint verification.

Original languageEnglish
Title of host publication2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2010
Pages795-801
Number of pages7
DOIs
StatePublished - 2010
Externally publishedYes
Event2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2010 - San Francisco, CA, United States
Duration: 13 Jun 201018 Jun 2010

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919

Conference

Conference2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2010
Country/TerritoryUnited States
CitySan Francisco, CA
Period13/06/1018/06/10

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