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Effective control of polarity in Bi 0.9La 0.1FeO 3 thin films by dopant-related internal bias

  • Yang Wang*
  • , Weigang Chen
  • , Zuhuang Chen
  • , Naidu Chukka Rami
  • , Junling Wang
  • , John Wang
  • , Lang Chen
  • *Corresponding author for this work
  • Nanyang Technological University
  • National University of Singapore

Research output: Contribution to journalArticlepeer-review

Abstract

The as-grown polarizations of Mn- and Ti-doped Bi 0.9La 0.1FeO 3 thin films (BLFMn and BLFTi) are demonstrated to align in an upward direction due to the occurrence of an internal bias field E i that points up. On the basis of the conductivity and XPS as well as leakage current measurements, E i in BLFMn is attributed to an asymmetric distribution of charged defects, while the elevated Fermi level and broadened positively charged depletion zone are supposed to induce E i in BLFTi. The different physical origins of E i are intimately connected with the nature of aliovalent acceptor and donor dopants of Mn and Ti ions, which is further verified by the consistent voltage offsets in the piezoelectric hysteresis loops. This suggests an effective way to control the polarity of ferroelectric thin films through the tuning of chemical doping levels.

Original languageEnglish
Pages (from-to)919-923
Number of pages5
JournalPhysica Status Solidi (A) Applications and Materials Science
Volume208
Issue number4
DOIs
StatePublished - Apr 2011
Externally publishedYes

Keywords

  • BiFeO
  • piezoresponse force microscopy
  • polarity

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