Abstract
Lead-magnesium niobate-lead titanate (PMN-PT) thin films with and without the TiO2 seed layer were deposited on Pt/Ti/SiO2/Si substrates through pulsed laser deposition. The study aimed to characterize the effect of the TiO2 seed layer on the phase composition and properties of PMN-PT film. Without the TiO2 seed layer, the pure perovskite phase could be obtained in the thinner PMN-PT film while with the TiO2 seed layer, the pure perovskite phase was formed in the thicker PMN-PT film. The ferroelectric properties of PMN-PT films with the TiO2 seed layer were exhibited. As a result, the maximum amount of remnant polarization reached the amount of 32 μC/cm2 for the PMN-PT thin film with the TiO2 seed layer.
| Original language | English |
|---|---|
| Pages (from-to) | 1920-1923 |
| Number of pages | 4 |
| Journal | Microelectronic Engineering |
| Volume | 85 |
| Issue number | 9 |
| DOIs | |
| State | Published - Sep 2008 |
| Externally published | Yes |
Keywords
- PMN-PT film
- Perovskite phase
- Remnant polarization
- TiO seed layer
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