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Effect of Pt film thickness on PtSi formation and film surface morphology

  • Jinghua Yin*
  • , Wei Cai
  • , Yufeng Zheng
  • , Liancheng Zhao
  • *Corresponding author for this work
  • Harbin University of Science and Technology
  • Harbin Institute of Technology

Research output: Contribution to journalArticlepeer-review

Abstract

The effect of Pt film thickness on the formation of platinum silicide (PtSi) phase, distribution of silicides, and surface morphology of PtSi/ Si films was investigated with X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and atomic force microscopy (AFM). It was shown that when the film structure was changed from PtSi/Si to Pt/Pt2Si+PtSi/PtSi/Si, the film morphology changed from a smooth surface to a coarse columnar structure with the increase of the Pt film thickness.

Original languageEnglish
Pages (from-to)329-334
Number of pages6
JournalSurface and Coatings Technology
Volume198
Issue number1-3 SPEC. ISS.
DOIs
StatePublished - 1 Aug 2005
Externally publishedYes

Keywords

  • Pt film
  • PtSi
  • Surface morphology
  • Thickness

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