Abstract
The effect of Pt film thickness on the formation of platinum silicide (PtSi) phase, distribution of silicides, and surface morphology of PtSi/ Si films was investigated with X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and atomic force microscopy (AFM). It was shown that when the film structure was changed from PtSi/Si to Pt/Pt2Si+PtSi/PtSi/Si, the film morphology changed from a smooth surface to a coarse columnar structure with the increase of the Pt film thickness.
| Original language | English |
|---|---|
| Pages (from-to) | 329-334 |
| Number of pages | 6 |
| Journal | Surface and Coatings Technology |
| Volume | 198 |
| Issue number | 1-3 SPEC. ISS. |
| DOIs | |
| State | Published - 1 Aug 2005 |
| Externally published | Yes |
Keywords
- Pt film
- PtSi
- Surface morphology
- Thickness
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