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Effect of probe offset on ultra-precision measurement of circular profile

Research output: Contribution to journalConference articlepeer-review

Abstract

In order to further improve the ultra-precision measuring accuracy of circular profile, the sources of probe offset error was analyzed and one-parameter measurement model was established that with probe offset parameter only, and it was concluded that probe offset has a significant effect on the measurement of an object with a small size or large profile deviation; the two-parameter measurement model that with probe offset error d and eccentricity error (e,α) was simultaneously analyzed, and the accurate interaction relationship between d and e is obtained. Simulation results show that probe offset error has a significant amplifying action to eccentricity error, and the measurement error increases as probe offset error increase. This paper provides the basis for further improvement of ultra-precision measuring accuracy of circular profile.

Original languageEnglish
Article number71330G
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume7133
DOIs
StatePublished - 2009
Event5th International Symposium on Instrumentation Science and Technology - Shenyang, China
Duration: 15 Sep 200918 Sep 2009

Keywords

  • Eccentricity
  • Probe offset
  • Roundness
  • Ultra-precision measurement

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