Abstract
In order to further improve the ultra-precision measuring accuracy of circular profile, the sources of probe offset error was analyzed and one-parameter measurement model was established that with probe offset parameter only, and it was concluded that probe offset has a significant effect on the measurement of an object with a small size or large profile deviation; the two-parameter measurement model that with probe offset error d and eccentricity error (e,α) was simultaneously analyzed, and the accurate interaction relationship between d and e is obtained. Simulation results show that probe offset error has a significant amplifying action to eccentricity error, and the measurement error increases as probe offset error increase. This paper provides the basis for further improvement of ultra-precision measuring accuracy of circular profile.
| Original language | English |
|---|---|
| Article number | 71330G |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 7133 |
| DOIs | |
| State | Published - 2009 |
| Event | 5th International Symposium on Instrumentation Science and Technology - Shenyang, China Duration: 15 Sep 2009 → 18 Sep 2009 |
Keywords
- Eccentricity
- Probe offset
- Roundness
- Ultra-precision measurement
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