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Effect of pressure on microstructure and properties of high silicon electrical steel by EB-PVD

  • Xiao Li*
  • , Baiyang Lou
  • , Huaping Wu
  • , Xiaodong He
  • , Yue Sun
  • *Corresponding author for this work
  • Zhejiang University of Technology
  • Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The effect of pressures on microstructure and properties of as-deposited high silicon electrical steel by EB-PVD during hot pressing was studied. X-ray diffraction (XRD) and scanning electron microscopy (SEM) were used to characterize the phase composition and morphology; the density and electrical resistivity were measured using the bottle method and four-probing method, respectively. It was found that the density increased from 7.25×10 3 kg/m 3 to 7.5 ×10 3 kg/m 3, while the electrical resistivity decreased from 85μΩ·cm to 75μΩ ·cm with the increase of the pressure from 30 MPa to 60 MPa.

Original languageEnglish
Title of host publicationRecent Trends in Materials and Mechanical Engineering Materials, Mechatronics and Automation
Pages348-351
Number of pages4
DOIs
StatePublished - 2011
Event2011 International Conference on Recent Trends in Materials and Mechanical Engineering, ICRTMME 2011 - Shenzhen, China
Duration: 27 Jan 201128 Jan 2011

Publication series

NameApplied Mechanics and Materials
Volume55-57
ISSN (Print)1660-9336
ISSN (Electronic)1662-7482

Conference

Conference2011 International Conference on Recent Trends in Materials and Mechanical Engineering, ICRTMME 2011
Country/TerritoryChina
CityShenzhen
Period27/01/1128/01/11

Keywords

  • Densification
  • EB-PVD
  • Electrical steel
  • Hot pressing

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