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Effect of multilayer films and current on IMC formation in solder joints

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, the interfacial reaction of Cu/Sn solder joint was investigated under different structures of the solder and soldering conditions. The monolayer and multilayer Sn thin film solder joint was heated at temperature of 350°C for 3min, 5min, 10min. The result indicated that the multilayer film of Cu/Sn can reduce the diffusion distance between Cu and Sn, which can promote the growth of Cu3Sn. In addition, the current was added while heating the Cu/Sn samples. The heat generated by current can also promote the growth of Cu3Sn. So that the single IMC solder joints can be fabricated in short time.

Original languageEnglish
Title of host publication18th International Conference on Electronic Packaging Technology, ICEPT 2017
EditorsChenxi Wang, Yanhong Tian, Tianchun Ye
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1561-1563
Number of pages3
ISBN (Electronic)9781538629727
DOIs
StatePublished - 19 Sep 2017
Event18th International Conference on Electronic Packaging Technology, ICEPT 2017 - Harbin, China
Duration: 16 Aug 201719 Aug 2017

Publication series

Name18th International Conference on Electronic Packaging Technology, ICEPT 2017

Conference

Conference18th International Conference on Electronic Packaging Technology, ICEPT 2017
Country/TerritoryChina
CityHarbin
Period16/08/1719/08/17

Keywords

  • IMC
  • current
  • multilayer films
  • solder joint

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